Fourier transform spectral imaging microscopy (FT-SIM) and scanning Raman microscopy for the detection of indoor common contaminants on the surface of dental implants
- Anna Lutin
- , Valery Bulatov
- , Yusuf Jadwat
- , Neil H. Wood
- , Liviu Feller
- , Israel Schechter*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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(Scopus)